While we design a gate for nominal operation conditions and typical
device parameters, we should always be aware that the actual operating
temperature might very over a large range, and that the device
parameters after fabrication probably will deviate from the nom-inal
values we used in our design optimization process. Fortunately, the
dc-characteristics of the static CMOS inverter turn out to be rather
insensitive to these variations, and the gate remains functional over a
wide range of operating conditions. This already became apparent in
Figure 5.7, which shows that variations in the device sizes have only a
minor impact on the switching threshold of the inverter. To further
confirm the assumed robust-ness of the gate, we have re-simulated the
voltage transfer characteristic by replacing the nominal devices by
their worst- or best-case incarnations. Two corner-cases are plotted in
Figure 5.11: a better-than-expected NMOS combined with an inferior PMOS,
and the opposite scenario. Comparing the resulting curves with the
nominal response shows that the variations mostly cause a shift in the
switching threshold, but that the operation of the