MAT 374 MWF 700A Question

MAT 374 MWF 700A

Suppose you work for a computer chip manufacturer. You are tasked with designing an assembly line procedure that will supply 3 mA of current to the chip within an error tolerance of .01 mA. Keeping in mind that this process will certainly have variance over time, answer the following:

Identify three key sources of possible variance in this scenario.

  • The drift of potential difference (voltage). Ohm’s law: I = E/R. Since the resistance will be constant for most of the time if the voltage increases the current will increase and vice versa.
  • The ambient temperature of the chip. If the temperature increases the resistance will increase as well and vice versa.
  • The cross-section area of the chip. This can affect the resistance then the current will change.

Design an experiment to help determine if the current process is meeting the required standard. Be sure to list any instruments required to conduct this experiment.

  • The experiment will be tested about the current goes through the chip. In this experiment, the electricity will be applied to the chip couple of times. For each trial, the voltage, current and temperature of the chip will be measured. For the experiment, a thermometer and an ammeter will be used. The data will be collected to see the changes of the current every time.

Identify the sample and population in your experiment.

  • The sample will be the experiment for testing of the current that will be applied to the chip and the population will be the current that will be used at the manufacture.

In testing the hypothesis of your experiment, would you use a mechanistic or empirical model?

  • The mechanics model will be a used in the hypothesis of this experiment. Since, we know the relationship between the voltage, current and resistance according to Ohm’s law: I = E/R.

Explain how probability models are useful when testing processes that vary over time. What would happen if we ignored the effects of chance?

  • The probability models are useful since it can tell how often the requirement from the sample is not met. For example, how often the current is outside the range of 2.99 mA and 3.01 mA. If it happens a lot, then we need to check with the power source for the manufacture. If we ignored the effects of chance, we can see the many defective products from the total goods. For example, if the current applied to the chip is not around 3.0 mA for most of the time. Most of the chip can not work properly as a product.

This assignment uses a scoring guide. Please review the scoring guide prior to beginning the assignment to become familiar with the expectations for successful completion.

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